Anritsu's Telecommunications Division (TCD) provides effective fault management systems enabling communication providers to compete faster with greater automation and fewer people. TCD offers customers the technology for rapid and accurate monitoring and testing of voice, data and fibre networks, allowing revenue to be generated with a minimum of downtime.
TCD provides access, test and performance monitoring of VF, DDS, DS1, DS3, ISDN, POTS, DLC, NGDLC and fibre-based circuits. Anritsu's TL1-based remote testing solutions also provide full compliance to Bellcore and industry standards.
According to TCD, with an exceptional tech support staff and highly trained customer service group, TCD customers can expect full EF&I, technical support; acceptance test procedures, project management, in-depth operations, engineering and maintenance training, quality product documentation and updates to the latest Bellcore standards.
RFTS
Anritsu's remote fibre test system, RFTS, is a complete integrated solution for testing and managing OSP fibre networks. Combining access, test, fault location and an operations system (OS) in one system, RFTS capitalises on Anritsu's OTDR technology for fast, accurate and repeatable measurements up to 200 km on working and unused fibres.
The broadband test system (BTS), Model 9650, is designed to meet DS3, DS1, DS0 (DDS), FT1 and Sonet testing requirements. The BTS is a multi-user, multifunction digital test system for testing at broadband, wideband and narrowband rates and is designed to access and test circuits traversing 3/3, 3/1, 1/0 or 3/1/0 digital cross-connect systems.
eDATS
The enhanced digital access and test system (eDATS) is Anritsu's latest generation offering features, performance and customer value for managing DS1 and DS0 circuits in HiCAp networks. Interfacing at the DSX-1, eDATS allows one to monitor and test DS1, DS0, VF, DDS and fractional T1 circuits, from one compact shelf. eDATS offers the latest industry standard DS1 performance monitoring features including PM from intelligent NIUs. A full suite of standard test patterns and measurement parameters is provided, including loopback codes and user programmable test patterns. Hitless fractional T1 ensures that only the circuit under test is disturbed. An audio monitoring interface is provided when testing VF circuits.
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