Tel: | +27 21 852 6642 |
Email: | [email protected] |
www: | www.x-sight.co.za |
more information about X-Sight X-Ray Services |
Nikon Metrology’s latest XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor
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X-Tek's Revolution inspection system incorporates the manufacturer's NanoTech submicron technology to provide high resolution and magnification capabilities within a compact X-ray system.
Offering a
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