Comtest announced the availability of Tektronix’ new software plugin for its AFG31000 arbitrary function generator (AFG), making it possible to perform crucial double pulse testing in less than a minute, and thus saving a significant amount of time when compared to alternative methods.
With the new Double Pulse Test software, engineers can quickly define pulse parameters from a single window on the AFG31000’s large touchscreen display and then generate the pulses they need to perform testing. The application offers impedance adjustment of pulse width and the time gap between each pulse, up to 30 pulses. Pulse widths can range from 20 ns to 150 µs.
Double pulse testing is used by researchers and design and test engineers in the power and semiconductor industries to measure and evaluate the switching parameters and dynamic behaviour of power devices, including those made from wide bandgap materials such as silicon carbide (SiC) and gallium nitride (GaN).
To perform a double pulse test, an engineer needs to precisely generate at least two voltage pulses with varying pulse widths and timing to trigger a MOSFET or IGBT power device. Measurements are taken with an oscilloscope like a Tektronix 5 Series MSO. However, generating these pulses has been challenging with today’s test equipment, forcing researchers and engineers to manually create waveforms using PCs or microcontrollers – a time-consuming and error-prone approach.
Introduced last year, the AFG31000 features a large touchscreen, a new user interface, the patented InstaView technology feature that automatically detects and compensates for impedance mismatches, programmable waveform sequencing, and a new ArbBuilder tool for easily creating and editing arbitrary waveforms.
Featuring a 9-inch touchscreen display, AFG31000 series instruments are available in 1- or 2-channel configurations and deliver 14-bit vertical resolution along with 250 MSps, 1 GSps or 2 GSps sample rate performance.
High-speed AWG generates up to 20 sine waves Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.
Read more...Digitisers upgraded with pulse generator option Vepac Electronics
Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.
Read more...Companies collaborate on EnviroMeter Avnet Silica
Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.
Read more...PCB test points Vepac Electronics
Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.
Read more...RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.
Read more...Proximity sensor with VCSEL Avnet Abacus
Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.
Read more...CNH data output devices for AI applications Altron Arrow
Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.
Read more...Webinar: The key to smart occupancy
Test & Measurement
This one-hour session will allow the attendee to discover the company’s latest infrared sensor with high-sensitivity presence and motion detection capabilities.
printer friendly version