X-ray machine performs 3D CT analysis
1 January 2015
Manufacturing / Production Technology, Hardware & Services
X-eye SF160ACT is a high-resolution, micro-focus X-ray system made by SEC for the inspection of semiconductors, PCB assemblies and electronic components. Even micro-scale hidden defects can be detected in high resolution, thanks to the ability to magnify an object up to 4800 times and display the X-ray image at any angle using a 6-axis manipulator configuration.
The machine is built upon oblique CT (computed tomography) technology, which scans from an oblique direction while the object is rotating horizontally. This provides highly magnified 3D images of flat and large components without geometric interferences, and realises short source-to-object distance (SOD).
The system features a 460 x 510 mm table size and is controlled via a user-friendly software interface on a 24” LCD. It also has an automatic BGA inspection module that performs calculation of BGA diameter and void percentage, and produces a pass/fail verdict. A complete collection of annotation, reporting, measurement and image processing functions comes standard.
For more information contact Igmar Grewar, Quamba Technologies, +27 (0)83 417 4294, [email protected], www.quamba.co.za
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