Test & Measurement


Benchtop LCR meters

30 May 2012 Test & Measurement

Hioki announced the launch of three new LCR meters. The IM3523, IM3533 and IM3533-01 are designed for use in the electronic component market, from production-line environments to research and development.

The IM3523 delivers convenience when used on electronic component production lines, while the IM3533 augments the IM3523’s features with functions designed to accommodate testing of transformers and induction coils. Finally, the IM3533-01 expands the capabilities of the IM3523 and IM3533 by adding extensive functionality for use in research and development applications.

All three instruments offer expanded measurement frequency and measurement signal ranges compared to Hioki’s previous models. These increases allow them to be used in a more extensive range of measurement applications while delivering a higher level of operator convenience. They deliver basic accuracy of ±0,05% of reading for Z (impedance) measurement.

The IM3523 takes just 2 ms to perform measurements that took 5 ms (1 ms = 1/1,000 s) with previous models, boosting measurement efficiency. All three instruments’ contact check functionality detects broken wires and poor contact with samples during measurement, reducing the risk of undetected defects to enable higher-reliability measurement.

The IM3533 provides functionality that is well suited to the measurement of targets such as windings, induction coils and transformers. DCR measurement with a temperature correction function is supported for windings and transformers, and the instrument’s support for internal DC bias measurement (within a ±5 V range) is useful when measuring tantalum and other polarised capacitors. The ability to measure specific components allows the IM3533 to perform a broader range of measurements.

The IM3533-01 further augments the functionality of the IM3523 and IM3533 with a frequency sweep function, ideal for use by research and development departments. This lets the user observe measurement variations at each frequency in a specified range, and measurement results can be saved on computers and other devices via a USB memory stick or other interface, allowing data for each frequency point to be analysed.



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