Test & Measurement


PXI digitisers

25 May 2011 Test & Measurement

National Instruments has developed a new high-bandwidth PXI digitiser in cooperation with Tektronix. The PXIe-5186 achieves up to 5 GHz bandwidth and 12,5 GSps sample rates. NI also announced the PXIe-5185, which delivers 3 GHz bandwidth along with 12,5 GSps sample rate. Both digitisers are part of the National Instruments PXI-based hardware and software platform for automated test applications.

Proprietary Tektronix performance oscilloscope ASICs in the new digitisers provide the foundation for high-speed signal acquisition with low noise and high linearity. The low 500 fs RMS integrated jitter of the instruments results in a 5,5 effective number of bits (ENOB) at 5 GHz. Designed for the 3U PXI Express platform, the digitisers can stream at rates as fast as 700 MBps and synchronise channels on multiple modules to within160 ps resolution. These capabilities make the devices suitable for applications such as automated production test, semiconductor ATE and high-energy physics measurement systems.

The digitisers work with NI LabVIEW graphical design software for instrument control and automation, the NI LabWindows/CVI ANSI C software development environment and Microsoft Visual Studio .NET development tools for a wide range of programming options. Engineers can program the instruments using the NI-SCOPE instrument driver or the new LabVIEW Jitter Analysis Toolkit, which offers a library of functions optimised for high-throughput, jitter, eye diagram and phase noise measurements.

For more information contact National Instruments, 0800 203 199, [email protected], www.ni.com/southafrica





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