Test & Measurement


LTE-Advanced test system

16 March 2011 Test & Measurement

LTE-Advanced is an evolution of LTE. It is initially being specified as part of Release 10 of the 3GPP specification. A number of new technologies are being introduced into LTE-Advanced to enable peak data rates of up to 1 Gbps in the downlink and 500 Mbps in the uplink. To achieve such a high peak data rate, LTE-Advanced supports a maximum bandwidth of 100 MHz by aggregating up to five component carriers, each up to 20 MHz wide.

Agilent’s new Signal Studio and 89600B Vector Signal Analysis software for LTE-Advanced support the generation and analysis of FDD and TDD signals compliant with the 3GPP Release 10 standard. Using these solutions, design engineers can start testing physical layer implementations of LTE-Advanced devices while gaining insight into the root causes of design problems.

The platform supports FDD and TDD per 3GPP Release 10 for both uplink and downlink signal configurations. Carrier aggregation is provided for both contiguous and non-contiguous component carrier configurations for up to 100 MHz I/Q bandwidth using Agilent’s MXG vector signal generators and up to 140 MHz analysis bandwidth with the Agilent PXA signal analyser. Independent setup parameters are available for each component carrier, including any LTE-Advanced specified bandwidth or modulation type.

The system also supports simultaneous analysis of up to five component carriers and troubleshooting of each component carrier using a rich selection of measurements, including EVM, CCDF and more. Enhanced uplink-clustered SC-FDMA and simultaneous control and data channel (PUCCH and PUSCH) are also supported.



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