Test & Measurement


High-speed serial interconnect analysis

26 May 2010 Test & Measurement

Agilent Technologies has introduced the time domain reflectometer (TDR) application software option for the E5071C ENA network analyser.

The combined E5071C and TDR application software comprise a one-box solution for high-speed serial interconnect analysis and includes three new features: simple and intuitive operation, fast and accurate measurements, and lower cost of ownership. The solution is targeted at signal integrity engineers who require efficient design and verification in R&D, quality assurance and manufacturing.

The E5071C has a wide frequency range up to 20 GHz and versatile functions and, together with the TDR option, provides time domain, frequency domain and simulated eye diagram measurements. The user interface provides a similar look and feel to a traditional TDR oscilloscope. The TDR software includes a measurement setup wizard that provides users with a simple and intuitive operation experience.

The software offers wide dynamic range and a variety of calibration methods, ensuring fast and accurate measurements. With a robust architecture that protects against electrostatic discharge and flexible bandwidth upgrade paths, the E5071C with the TDR option is designed for use in high-speed PCB, cable assembly and connector testing for serial data applications.



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