Test & Measurement


Logic tester for PCB assemblies

12 May 2010 Test & Measurement

The Advanced Test Module (ATM) from ABI Electronics is a solution designed for the test and diagnostics of all logic PCB assemblies, from single component testing in-circuit up to complete assembly functional checks.

Nowadays, the need for testing and maintaining electronics boards is greater than ever. In a fast-paced industry, PCBs and equipment are constantly evolving and therefore become quickly obsolete. This situation creates a ‘lagging’ effect for a lot of equipment which is fit for purpose but can no longer be serviced by the supplier (or possibly at a high cost). This responsibility now lies with repair companies and a demand for high specification in-circuit test equipment has been created.

At the same time, manufacturing companies in all sectors of the industry fall under pressure to test all electronics assemblies before they are placed in their final packaging. This is true for global leaders who manufacture all assemblies in-house, but also for smaller businesses which outsource contract electronics. The market demands that PCBs need to be functionally checked quickly and efficiently with an end-of-line solution or board-level tester, or both.

The ATM is designed to meet these demands by offering high test capabilities and comprehensive fault diagnosis with a high degree of flexibility. Powerful test combinations ensure fault coverage on PCBs or components and include functional, connections, voltage, thermal and V-I signature tests. The system is suitable for all logic families (TTL, CMOS, LVTTL, ECL, DTL, LSI, RTL, PECL, LVPECL etc) and provides power-on and power-off tests.

The test module is library driven for ease of use and includes a graphical test generator for customised test vectors, as well as the TestFlow manager for automated test sequences. Pass/fail results are provided for inexperienced users, in addition to data-logging capabilities for traceability and flexible software with user access control.



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