Test & Measurement


25 GHz differential probe

14 April 2010 Test & Measurement

LeCroy has launched the WaveLink differential solder-in probe with 25 GHz bandwidth, for engineers who find it insufficient to use SMA cables to input signals directly into their oscilloscope.

WaveLink high-bandwidth probes provide good rise time performance, and the new probe extends this performance to 17,5 ps for a 25 GHz probe used with a 25 GHz oscilloscope, the same as the oscilloscope-only rise time. In addition, baseline electrical noise in the probe product line has been lowered and is only 3,1 mVrms at 25 GHz, and only 1,6 mVrms at 13 GHz.

In addition, the probes exhibit enhanced AC loading in the mid-band and high frequency range with only 350 Ω at 7 GHz, 575 Ω at 13 GHz, 325 Ω at 16 GHz, 160 Ω at 20 GHz, and 120 Ω at 25 GHz. This combination of performance and bandwidth is beneficial for accurately characterising next-generation serial data signals, and comes close in signal fidelity to cabled inputs. This is especially important when oscilloscope channels must be conserved for multiple differential signal measurements, such as with multi-lane protocols like PCI Express.

The new 25 GHz WaveLink probes are of a transmission line design with an attenuating tip followed by an amplifier output to a differential transmission line connecting to the oscilloscope with a platform/cable assembly. LeCroy has improved on the solder-in tip design by making the damping resistors on the tip field replaceable so that an engineer, faced with a damaged tip, can simply solder a new damping resistor to the tip and quickly resume work. Each solder-in probe comes standard with 10 spare damping resistors, and more can be ordered separately.

For more information contact Comtest, +27 (0)11 608 8520, [email protected], www.comtest.co.za



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