Ingun has developed a new test probe tip style with an innovative self-cleaning function for longer term contacting reliability and lifecycle.
The tip style 79 (star) has a number of self-cleaning, knife-type edges. Due to their horizontal arrangement, these knife-like edges are suitable for contacting oblong-shaped, small and large beads with flux deposits that can stick to the tip.
For bead probe technology – by which small beads of solder can be directly applied onto conductors or onto micro-vias – Ingun has developed further special tip styles in cooperation with its global customers. The tip style 02 (flat) is preferably used for flux-free and/or small beads and the tip-style 60 (fine-serrated) is recommended (due to the fine, aggressive points) for breaking open the surfaces of beads which are coated with flux deposits, as well as for suitably large beads.
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