The ADS5400 from Texas Instruments is an analog-to-digital-converter (ADC) that combines 12 bits of resolution with a 1 GSps sampling rate. It offers a signal-to-noise ratio (SNR) of 59 dBFS and 75 dBc spurious-free dynamic range (SFDR) in first Nyquist, and 58 dBFS SNR and 70 dBc SFDR performance for intermediate frequencies (IFs) beyond 1000 MHz. A fully buffered analog input isolates the onboard sample-and-hold’s internal switching to prevent disturbing the signal source, while providing a high-impedance input.
The ADC has a 2,1 GHz input bandwidth, for wideband signals in oversampling and undersampling applications with 200 MHz or greater signal bandwidth. The buffered analog input provides constant input impedance across time and frequency and eliminates sample-and-hold kickback, simplifying input matching for passive and active analog front end. The device’s adjustable fine gain, offset and phase ease the interleaving of two or more ADCs to create a multiGSps digitiser, or the balancing of two ADCs in an I/Q receiver. Its user-selectable single- or dual-bus DDR LVDS outputs provide designers flexibility to choose between I/O speed and pin-count.
Developed on TI’s high-speed, proprietary BiCom3 complementary bipolar SiGe technology, the monolithic ADS5400 is specified over the full industrial temperature range (-40°C to 85°C). The BiCom3 technology’s silicon-on-insulator (SOI) process makes it well suited for high-temperature and high-radiation environments.
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