Test & Measurement


Optical spectrum analyser

15 April 2009 Test & Measurement

Exfo has introduced its newest high-performance optical spectrum analyser (OSA) to assist network operators in their deployment of current and next-generation optical networks.

The FTB-5240S OSA test module, housed in either the FTB-200 compact platform or the newly launched FTB-500 Platform, is purpose-built for fast and accurate dense wavelength-division multiplexing (DWDM) network commissioning and high-speed network upgrades up to 40G.

Within the FTB-200 platform, it is the smallest, high-performance solution for spectral characterisation of next-generation networks. When equipped with in-band optical-signal-to-noise-ratio (OSNR) measurement capabilities in the FTB-500 platform, this versatile OSA can be combined with the FTB-8140 Transport Blazer to create a unique ROADM/POTS/40G test solution.

Exfo’s proprietary in-band OSNR test method delivers highly accurate measurements for next-generation systems in which noise can fluctuate from channel to channel. Traditional OSNR test tools tend to produce erroneous results, especially for ROADMs and 40G systems. The built-in polarisation diversity detection capabilities on Exfo’s new OSA enable customers to obtain accurate and automated OSNR measurements.

The FTB-5240S OSA benefits from ultra-fast scanning and analysis inside the new FTB-500 platform. A 90 dB dynamic range scan can be carried out within 1 second, including complete data analysis. The OSA also supports new modulation schemes, such as NRZ, duobinary, DPSK and QPSK, which present large line widths and often display multiple peaks. In-depth analysis ensures the correct identification and signal measurement of each carrier.

For more information contact Chris Nel, Lambda Test Equipment,+27 (0)12 349 1341, [email protected], www.lambdatest.co.za



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

Identifying interference in 5G and LTE networks
Test & Measurement
The latest Field Master software release provides a dual display of the LTE or 5G Frame structure, with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots.

Read more...
High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...