Test & Measurement


Exfo adds fibre channel support to test platform

25 June 2008 Test & Measurement

Exfo has added fibre channel support to its recently introduced IQS-8120NGE and IQS-8130NGE Power Blazer multiservice test modules, simplifying the testing of multiservice products by network equipment vendors.

In addition to offering SDH/SONET/OTN, next-gen SDH/SONET and Ethernet testing capabilities up to 10/10,7 Gbps, the modules now offer optional support for 1x, 2x, 4x and 10x fibre channel rates. This extended offering addresses the stringent testing requirements for multiservice products by system verification, R&D and manufacturing groups, allowing them to perform automation along with test and troubleshooting routines on network equipment that supports different protocols on the same interface.

The modules provide the versatility to support either single- or multi-application testing capabilities on a single module, combined with Exfo's unified architecture which can concurrently support physical layer testing modules along with transport and datacom testing modules.

In line with the offering of user-friendly and future-proof test solutions, fibre channel support is provided as a software option on the IQS-8120NGE and IQS-8130NGE modules, allowing network equipment manufacturers to add the functionality in line with their testing timeline and customise their test solution to their exact requirements, using the least amount of hardware but without compromising on functionality.

For more information contact Chris Nel, Lambda Test Equipment, +27 (0)12 349 1341, [email protected], www.lambdatest.co.za



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

Identifying interference in 5G and LTE networks
Test & Measurement
The latest Field Master software release provides a dual display of the LTE or 5G Frame structure, with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots.

Read more...
High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...