Texas Instruments has introduced a high-performance 16-bit, dual-channel, 1 GSps digital-to-analog converter (DAC) family. The new single-and dual-channel DACs feature a low-voltage differential signalling (LVDS) data input port at 1 Gbps, providing up to 400 MHz signal bandwidth. In addition, the family offers flexible configuration options as well as tools and support to ease design and speed time to market for base stations, wideband IF transmitters, radar, and test and measurement equipment.
Offered in a small 9 x 9 mm QFN package, the devices provide several configuration options to support different transmit architectures, such as direct up-conversion, real or complex IF, and different wireless air interfaces such as WCDMA, TD-SCDMA, WiMAX and LTE. For an output frequency of 160 MHz, the devices achieve 73 dB ACPR for a single-carrier WCDMA application or 67 dBc for a four-carrier application. Along with the single-channel DAC5681 and DAC5681Z, the dual DAC5682Z offers many digitally configurable features such as selectable low-, high- or bypass filter modes, 2x, 4x or bypass interpolation, an optional ±Fs/4 or ±Fs/8 coarse mixer, an optional 2x-32x clock multiplying PLL and an 8-sample input data FIFO.
TI also offers a complete suite of evaluation modules (EVMs) to allow designers to make rapid systems-level evaluation with the DAC5682ZEVM for baseband outputs and the TSW3082 for RF output. In addition, across its complete DAC portfolio, TI offers the TSW3100 digital pattern generator, which provides inputs to either evaluation platform via a 1 GSps LVDS bus with up to 256 mega vector pattern depths.
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