Today, devices under test (DUT) are often powered by multiple DC input voltages and it is these very same power sources that can cause extensive damage to sensitive DUT circuitry if not turned off in a controlled manner.
Particularly susceptible are individual assemblies such as satellites, which are prone to damage; these assemblies are, ironically, also the most costly.
"Ideally," says Steve Alves, managing director at Concilium Technologies, "multiple inputs must be turned off in a particular sequence, and this also includes specific timing between each switch off. In the case of a power fault condition such as over-voltage, over-temperature or over-current on one of the power supply outputs, it is also important to follow a sequenced shutdown."
However, creating a controlled and external shutdown sequence can be challenging, and often, depending on the method used, not overly successful.
For example, in the case of diodes - used between inputs as clamps - the results can vary; this is also the case when relays are used in series with each input. Software, on the other hand, responds slowly and imprecisely.
"The safest way is to build the intelligence into the power system itself, enabling it to control the sequenced shut-down as opposed to imprecise, external methods," recommends Alves.
Agilent Technologies' N6700 Modular Power System and N6705A DC Power Analyser both offer the above built-in sequencing control functionality. Each system can precisely control the turn-off sequence of four outputs. These systems can also be loaded with up to four power supply output modules selected from more than 20 available. Synchronisation across mainframe systems is also possible, which in turn facilitates the timed shut-downs of more than four outputs.
Concludes Alves: "Controlling the power supply shut-down sequence with the power supply system itself, can greatly reduce the effort, imprecision and resultant complexity associated with more traditional external shutdown control methods."
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