Harmonic/flicker measurement software complies with updated standards

30 April 2008 Test & Measurement

A new version of the harmonic/flicker measurement software for the Yokogawa WT3000 precision power analyser has been released to comply with new international power quality standards.

The new 761922 harmonic/flicker measurement software has been developed in response to new regulations for harmonic current over 16 A, which is enforced as a low frequency EMC test. The relevant new standards, which include precise definitions of measurement procedures and settings, are EN61000-3-11/IEC61000-3-11: Limitations of voltage fluctuations and flicker - equipment rated current >16 A per phase; and EN61000-3-12/IEC61000-3-12: Limits for harmonic current emissions - equipment rated current >16 A per phase.

The upgraded software allows engineers without specialised knowledge to perform a range of operations using the WT3000, including value limit judging functions for standards compliance and the production of test reports.

The software requires the power analyser to be fitted with the 30 A input option as well as the advanced computation and flicker measurement functions. With a basic power accuracy of ±0,02% of reading, DC and 0,1 Hz-1 MHz measurement bandwidth, and up to four input elements, the WT3000 provides a high-accuracy measurement solution for testing all types of power electronics products.

For more information contact Trevor Grundlingh, Protea Electronics, +27 (0)11 719 5700, [email protected], www.protea.co.za

Further reading:

Identifying interference in 5G and LTE networks
Test & Measurement
The latest Field Master software release provides a dual display of the LTE or 5G Frame structure, with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots.

Read more...

---

High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...

---

Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...

---

Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...

---

Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...

---

Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...

---

PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...

---

RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...

---

Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...

---

CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...

---