Test & Measurement


New variable speed optical attenuator for broadband testing

31 October 2007 Test & Measurement

JDSU has announced the latest version of its Variable Optical Attenuator for the JDSU Multiple Application Platform (MAP). The MAP Variable Optical Attenuator provides what is claimed to be the industry's highest performance optical power level control solution with the lowest optical impairments and the fastest transition speed in its class (up to 25 dB/s).

Because of massive traffic increases resulting from widespread deployment of broadband access technologies, equipment manufacturers are developing products that allow for higher bandwidth, longer reach and greater flexibility. This leads to more complex devices that require more rigorous testing because of the increased number of operating states. These complex devices include ROADMs, high power EDFAs, tuneable transponders and CWDM/DWDM transceivers that are designed to provide increased throughput, reduced costs, and improved reliability.

To validate these network systems and underlying subcomponents, test equipment must perform the required rigorous testing quickly and accurately. The latest MAP Variable Optical Attenuator was designed with these constraints in mind. Performance features include low insertion loss (less than 1,0 dB) and excellent wavelength flatness and transition speed. An optional built-in power monitor provides comprehensive closed-loop power control while the high power option is rated up to +33 dBm for single-mode fibre (+27 dBm for multimode fibre).

The JDSU MAP is a flexible instrumentation platform used for optical test and measurement applications that is available in two formats: a 19-inch 8-slot Master (MAP+2M00) and a 9,5-inch 3-slot Benchtop (MAP+2B00). They feature a common hot-swappable backplane compatible with over 15 different types of instrumentation cassettes. The MAP Master and MAP Benchtop include a 9-key keypad, colour display and remote communication ports.

MAP is used when instrumentation selection needs to be based on current requirements without compromising future requirements. The MAP+2B00 and MAP+2M00 provide the most cost-effective solutions for test sets requiring three or fewer cassettes and four to eight cassettes respectively. In both cases, future expansions are possible by populating the empty slots (if available) or adding a second independent MAP+2B00 or MAP+2M00.



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