Test & Measurement


Ampro offers extended temperature testing of boards

8 August 2007 Test & Measurement

Ampro provides optional extended temperature testing to its customers for most Ampro products.

By testing each unit in production, the extended temperature test verifies that all boards will operate and function at temperatures from -40 to 85°C.

Ampro uses a custom-designed modular card cage system in a state-of-the-art Thermotron environmental chamber to test products over the entire extended temperature range. This leading edge design is fully automated and uses custom-designed test software.

Each Ampro product is fully functionally tested during the entire range of extended temperature operation. Using the custom-designed application user interface, the board's test results are scanned into a database. This data is used for internal quality assurance audits. Customers who require this level of detail may request summarised test results. Each board is integrated with an Ampro MiniModule, which allows consistent controlling and monitoring of each board during the functional test.

All boards are ramped to the specific temperature profile and soaked before power is applied. This ensures that the BIOS properly initialises all hardware and the boards are ready for diagnostic testing. This process distinguishes Ampro from other companies that rely on a single power cycle while testing at extended temperatures. Ampro identifies each board that passes testing with a label that indicates the boards fulfill Ampro's stringent quality standards.



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

Identifying interference in 5G and LTE networks
Test & Measurement
The latest Field Master software release provides a dual display of the LTE or 5G Frame structure, with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots.

Read more...
High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...