Agilent Technologies has announced that it has won recognition for a number of its products by leading international publications. Test & Measurement World magazine recognised three of Agilents products in its 'Best in Test' 2005 competition and EDN magazine selected three of its products as 'Hot 100 Products of 2004'.
Agilent's N6700 power supply (MPS) was selected as one of 12 'Best in Test' winners and a finalist for 'Test Product of the Year 2005'. The DSO80000 Series oscilloscopes and N2X multiservices tester were honourable mention recipients. The Best in Test awards are presented annually to honour new products that are particularly innovative and useful.
Agilent's VEE Pro 7.0 software, Infiniium DSO80000 Series of 10-, 12- and 13 GHz realtime oscilloscopes, and FPGA dynamic probe were placed as three of EDN's 'Hot 100 Products of 2004'.
The N6700 modular power system offers industry-leading processing speeds and has a built-in digital multimeter for monitoring the voltage and current of the device under test, the choice of 50 W and 100 W output power levels, various voltage and current combinations, and three performance levels, all in a 1U-high package.
The 1U high N6700 modular power system offers industry-leading processing speeds, has a built-in digital multimeter and a choice of 50 W or 100 W output power levels
Agilent's Visual Engineering Environment (VEE) Pro 7.0 is an intuitive graphical programming environment that helps speed development of measurement, test and control applications in a wide variety of industries.
The DSO80000 Series oscilloscopes are the first to surpass the double-digit bandwidth barrier, offering engineers who design ultra-high-speed electronics an unmatched level of performance. Previously, oscilloscopes offered a maximum realtime analog bandwidth of 7 to 8 GHz. The 13 GHz realtime bandwidth of the DSO81304A offers a 50% performance improvement on this.
The DSO81304A oscilloscope offers designers of ultra-high-speed electronics 13 GHz realtime bandwidth.
Agilent's FPGA (field programmable gate array) dynamic probe is the industry's first commercially available dynamic probe application for logic analyser-based debug of Xilinx FPGAs. The new logic analysis application interacts with an on-chip virtual probing technology to enable logic analysers to measure up to 64 internal FPGA signals for each debug pin compared to traditional logic analysers, which measure a single internal FPGA signal for each debug pin.
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