Agilent Technologies has introduced a new class of instrument that it says can evaluate the critical performance characteristics of nearly all types of RF and microwave signal sources. The Agilent E5052A signal source analyser (SSA) replaces a large, complex rack of test equipment with a single instrument that can speed measurement times by a factor of 10.
The SSA is intended for R&D and manufacturing engineers in wireless communication, broadband optical, aerospace/defence and electronics to perform tests more accurately, at lower cost, and with greater simplicity.
Until now, says Agilent, there was no single instrument that could thoroughly characterise a wide variety of signal sources ranging from crystal oscillators to dielectric resonator oscillators (DROs), surface acoustic wave (SAW) oscillators, voltage-controlled oscillators (VCOs), IG-tuned oscillators, PLL and fractional-N frequency synthesisers, and RF and microwave ICs.
The SSA makes four types of measurements: frequency, power and DC current; transient measurements (frequency, phase and power versus time); spectrum monitor; and phase noise.
The SSA has been designed to meet or exceed current and anticipated requirements for each measurement type, says Agilent. Frequency, power and DC current tests are facilitated by simultaneously measuring frequency, RF power and DC current consumption. DC tuning (control) voltage and DC power sweeps enable a variety of measurements, including:
* Tuning sensitivity (frequency versus DC tuning voltage).
* Frequency pushing (frequency versus DC power voltage).
* RF power versus either DC tuning voltage or DC power voltage.
* DC current consumption versus either DC tuning voltage or DC power voltage.
Phase noise, frequency, and phase and power transients are key performance attributes by which many signal sources are evaluated. Some of the most stringent demands are found in the test specifications of 3 G and 4 G wireless access standards. Agilent uses a proprietary cross-correlation technique that it says lowers the instrument's noise floor at all offset frequencies without reducing measurement speed or compromising phase measurement performance. Using the SSA eliminates the need to purchase multiple standalone instruments, including a modulation domain analyser, DC power supply (for the DUT), digital multimeter, frequency counter, RF power meter, signal generator, and phase noise analyser.
The E5052A SSA offers a phase-noise frequency offset range of 1 Hz to 40 MHz. For transient measurements, it offers frequency resolution ranges from 5 Hz to 7 kHz with 10 ns to 160 ms sampling resolution, and frequency span can be selected between 1,6 MHz and 25,6 MHz in the heterodyne (narrowband) mode. The instrument also provides a direct (wideband) mode for frequency transients up to a 4,8 GHz span. In addition, the SSA includes exceptionally low-noise DC power sources for the DUT that eliminate the need for a low-pass filter.
The SSA mainframe offers a frequency range of 10 MHz to 7 GHz, and up to 110 GHz using Agilent downconverters. Other features of the Agilent E5052A include a Windows-style user interface, 10,4" TFT LCD touch screen display, and programming via SCPI and Microsoft Visual Basic for Applications that makes integration within an automated production test system simple and straightforward. Up to four windows plus one user window can be open on the display as well. Connectivity includes GPIB, USB and Ethernet.
For more information contact Andrew Lees, Concilium Technologies, 012 678 9200, [email protected]
| Tel: | +27 12 678 9200 |
| Email: | [email protected] |
| www: | www.concilium.co.za/test-measurement |
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